DOMINANT TECHNOLOGIES IN “INDUSTRY 4.0”
Experimental analysis of creep behaviour of solder alloys at near eutectic point by using indentation test
Eutectic solder alloys are widely used in the microelectronics industry. The phenomenon of creep and its mechanisms are important aspects that influence the performance of solder alloys. During the last two decades, a Pb – solder alloys is fast becoming a reality in lead free electronic products due to harmful caused as toxic material to environment and health, international legislative pressure and marketing. The replacement of Sn – Pb alloys with Sn-Ag-Cu (SAC) alloys needs reliable results for assuring the usage of this solder joints material in electronic industry. In this paper has been studied the creep behaviour of a group of alloy in the system Sn-Ag-Cu (SAC) near the eutectic point. In this research work we have used three different alloy samples which are 95, 5Sn-3, 8Ag-0,7Cu, 96, 5Sn-3, 0Ag-0,5Cu and 95, 46Sn-3, 58Ag-0,96Cu. Indentation technique has been conducted to study the creep behaviour of these three SAC alloys by determining the creep parameters at different temperatures. The temperature used was at room temperature 30oC until 100oC and the stress used was 64MPa-178MPa for the indentation diameter 1 mm and 0.5 mm. The experimental method and results of the creep parameters like activation enthalpy Q, the stress exponent n of the power law model and the parameter of the material A were briefly described in this paper. From the creep curves, constructed for alloys and considered loads, the values of creep stress exponent n were determined for the stud ied alloys.