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Author: Rozhnov A. B.

  • BASIC APPROACHES TO THE STUDY OF THE STRUCTURE AND PROPERTIES OF THIN OXIDE LAYERS ON THE EXAMPLE OF THE OXIDE FILMS OF ZIRCONIUM ALLOYS

    • Koteneva M. V.
    • Nikulin S. A.
    • Rozhnov A. B.
    Machines. Technologies. Materials., Vol. 10 (2016), Issue 2, pg(s) 11-12
    • Abstract
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    The structure and mechanical properties of the oxide films formed on zirconium alloys Zr – 1% Nb, Zr – 2,5% Nb upon autoclave tests at a temperature of 360oC and pressure of 18,6 MPa for 600 days were studied. Basic methodological approaches to the study of the structure and properties of thin oxide films were shown. The 10-15 µm thick oxide films of different structural types were shown to be formed on the specimens: the structures with predominately elongated grains and the layered structures. The structure of the oxide films subjected to loading determines both the crack formation stress and the character of fracture.

  • EFFECT OF EQUAL-CHANNEL ANGULAR PRESSING ON CRACK RESISTANCE AND CORROSION DAMAGE OF ZIRCONIUM ALLOY Zr-2.5%Nb

    • Belov V. A.
    • Nikulin S. A.
    • Rozhnov A. B.
    • Rogachev S. O.
    Machines. Technologies. Materials., Vol. 10 (2016), Issue 1, pg(s) 57-58
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    Testing method for static crack resistance has been developed and applied for thin sheet (sample thickness ~ 1mm) samples of zirconium alloy Zr-2.5%Nb. Linear parameter of fracture mechanics – stress intensity factor Kc has been determined. Alloy Zr-2.5%Nb after ECAP was tested for corrosion resistance in the physiological Ringer’s solution for two years.

  • THE COMPREHENSIVE TECHNIQUE FOR QUANTITATIVE ANALYSIS OF THE STRUCTURE IN COMPOSITE SUPERCONDUCTORS BASED ON Nb3Sn

    • Nikulin S. A.
    • Rozhnov A. B.
    • Rogachev S. O.
    • Zabolotnikova V. I.
    • Dergunova E. A.
    • Aliev R. T.
    Materials Science. Non-Equilibrium Phase Transformations., Vol. 1 (2015), Issue 2, pg(s) 44-45
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    The complex technique for study of the structure in Nb3Sn-based composite superconductors is developed. Technique is based on scanning and transmission electron microscopy on different scale levels. The possibility of using the method of focused ion beam for TEM sample preparation is confirmed.

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