An important requirement of digital electronic devices is the comprehensive provision of electromagnetic compatibility. In particular, it is necessary for electrical, electronic and radio equipment to ensure a sufficient level of noise immunity when exposed to microsecond pulse interference. The international standard IEC 61000-4-5 regulates the testing of equipment for microsecond impulse noise. Carrying out such physical tests is quite complicated and requires expensive equipment. The article proposes computer simulation of testing electronic devices in accordance with the requirements of IEC 61000-4-5.
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