Controlling wettability modes of the probes of the atomic-force microscope

  • 1 Faculty of Electronic Technology and Robotics, Department instrumentation, mechatronics and computerized technologies – Cherkassy State Technological University, Ukraine
  • 2 Instrument-making Faculty, Department of Instrumentation Design and Engineering – National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”, Ukraine


It has been established that in the study of a solid surface by atomic force microscopy, the hydrophobic interaction is more advantageous due to a decrease in the interaction forces between the probe and the liquid adsorbed on the surface under study. Despite the fact that silicon is a hydrophobic material, it has been shown that the material acquires hydrophilic properties in air, as a result of which the use of carbon-modified probes has been proposed. An approach to experimental statistical modeling is proposed, based on the experiment planning method, which shows that with a scanning speed of 12 μm / s, a scanning step of up to 82 nm and a delay time before scanning of 6 ms, the interaction force between the probe and the adsorbed liquid reaches minimum values. As a result of the research, it was found that with a decrease in the scanning speed, a scanning step and an increase in the delay time of the probe before measurement, the interaction between the probe and the liquid membrane is hydrophobic. It is shown that by changing the initial parameters, it is possible to control the hydrophobic interaction between the probe and the liquid. It has been established that increased air humidity leads to hydrophilic interaction. This is due to the increase in the thickness of the adsorbed liquid layer on the surface under study.



  1. B. Bhushan, Springer handbook of nanotechnology. Berlin, Germany: Springer, 2010.
  2. D. Sarid, Scanning Force Microscopy With Application to Electric, Magnetic and Atomic Forces. New York, NY, USA: Oxford University Press, 1991.
  3. S. N. Magonov, and Myung-Hwan Whangbo, Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis. Oxford, UK: Wiley, 2008.
  4. R. Wiesendanger, Scanning Probe Microscopy and Spectroscopy. Cambridge, UK: Universtiy Press, 1994.
  5. R. R. L. De Oliveira et al., Atomic Force Microscopy – Imaging, Measuring and Manipulating Surfaces at the Atomic Scale. Rijeka, Croatia: InTech, 2012.
  6. Artifact Review and Badging. [Online]. Available: publications/policies/artifact-reviewbadging. Accessed on: May 31, 2015.
  7. O. Teschke, and E. F. de Souza, “Hydrophobic surfaces probed by atomic force microscopy”, Langmuir, vol. 19, iss. 13, pp. 5357–5365, 2003.
  8. O. Yu. Komkov, “Influence of Liquid Meniscus on Surface Forces”, Journal of Friction and Wear, vol. 28, iss. 1, pp. 19- 31, 2007.
  9. M. A. Bondarenko, J. J. Bondarenkо, and S. A. Shelestovskaya, “Research of influence of the state of surface of probes for AFM on exactness and quality of the topograms”, in Proc. XXXI Intern. Scien. Conf. “Electronics and nanotechnology: ELNANO 2011”, Ukraine, April 12-14, 2011, P. 60.
  10. S. P. Vysloukh, Informatsiini tekhnolohii v zadachakh tekhnolohichnoi pidhotovky prylado- ta mashynobudivnoho vyrobnytstva (Information technologies in the tasks of technological preparation of instrument-making and machinebuilding production). Kyiv: NTUU «KPI», 2011.
  11. V. S. Antonyuk, S. O. Bilokin, M. О. Bondarenko, Yu. Yu. Bondarenko, et al., “Formation of Wear-Resistant Coatings on Silicon Probes for Atomic Force Microscopy by Thermal Vacuum Evaporation”, Journal of superhard materials, vol. 37, iss. 2, pp. 112-119, 2015.

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