International Scientific Journals
of Scientific Technical Union of Mechanical Engineering "Industry 4.0"

The Proposed study is based on the universal method of quasi-random Sobol sequences generation, efficiently used for address test sequence formation. As the mathematical model, a modification of the economical method of Antonov and Saleev is used. The main idea of the suggested approach is the use of generating matrixes with not necessarily the maximum rank for the procedure of generating test patterns. The proposed approach allows the generation of significantly more different sequences with different switching activities of the individual bits as well as the sequences itself. Mathematical expressions are obtained that make it possible to estimate the limiting values of the switching activity, both of the test sequence itself and the individual bits. Examples of the application of the proposed methods are considered.

In this paper a method of construction of a generator for address sequences with given values of switching activity, based on the Idea of Antonov and Saleev and with use of Toeplitz and Hankel matrices, was proposed. The broad possibilities of this approach and the limitations associated with conflicting requirements for the values of the rows of the matrix and their linear independence are shown. Examples of the formation of standard address sequences used for self-testing of storage devices are described