Generation of test sequences with a given switching activity
The Proposed study is based on the universal method of quasi-random Sobol sequences generation, efficiently used for address test sequence formation. As the mathematical model, a modification of the economical method of Antonov and Saleev is used. The main idea of the suggested approach is the use of generating matrixes with not necessarily the maximum rank for the procedure of generating test patterns. The proposed approach allows the generation of significantly more different sequences with different switching activities of the individual bits as well as the sequences itself. Mathematical expressions are obtained that make it possible to estimate the limiting values of the switching activity, both of the test sequence itself and the individual bits. Examples of the application of the proposed methods are considered.