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Author: Bondarenko I.

  • Determination of geometric parameters of gradient structures formed in optical glass by the electron beam method

    • Grechana О.
    • Skoryna E.
    • Bondarenko I.
    Machines. Technologies. Materials., Vol. 13 (2019), Issue 2, pg(s) 78-82
    • Abstract
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    The results of experimental studies of the geometry of gradient structures formed in optical glass by the method of electron-beam modification of its surface are presented. The expediency of using the atomic force microscopy method for determining the geometrical parameters of microlayers formed in the surfaces of optical materials by the method of their electron-beam modification is substantiated. A new method for determining the basic geometric parameters (thickness of the gradient layer, topology of the interface “gradient layer – the basis of the material”, surface microrelief, etc.) gradient structures, based on the method of atomic force microscopy is proposed. The proposed method is based on the principle of the complex application of various operating modes of an atomic-force microscope (the results of the instrument operation are considered, both in contact and in non-contact modes) in one measurement cycle. According to the proposed method, the dependencies between the change in the refractive index and the modes of electron-beam modification of the optical glass surface, as well as the dependence between the electron-beam effect modes and the geometric parameters of the gradient structure on the glass (thickness of the gradient structure, surface microrelief and interface between the layers and the base material ). The possibility of predicting the development of hidden microdefects at the interface “gradient layer – the basis of the material” is shown. Proved high reliability and adequacy of the proposed method by comparing the results obtained with the results of determining the geometric parameters obtained by other alternative methods.

  • TRANSPORT TECHNICS. INVESTIGATION OF ELEMENTS. RELIABILITY

    INTERACTION BETWEEN ROLLING STOCK AND RAILWAY TRACK WITH OF THE ELASTIC PROPERTIES OF THE BASE

    • Myamlin S.
    • Bondarenko I.
    Trans Motauto World, Vol. 3 (2018), Issue 3, pg(s) 113-115
    • Abstract
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    The main trend in considering the interaction of the railway track and the rolling stock is the studying of the parameters of the rigidity of the interaction. For the study, a model of the track design, described using the basic concepts of the theory of elasticity and the propagation of elastic waves was developed. The study of the peculiarities of the interaction of the rolling stock and the track, taking into account the elastic properties of the base, allows to expand the possibilities of solving the problems of ensuring their functionally safe operation with a certain level of operational efficiency.

  • INNOVATIVE SOLUTIONS

    THE INVESTIGATION OF THE NANORELIEFS OF OPTICAL ELEMENTS OF MEASURING INSTRUMENTS, WHICH MODIFIED BY ELECTRONBEAM MICROPROCESSING

    • Skoryna E.
    • Medyanyk V.
    • Bondarenko M.
    • Bondarenko I.
    • Bilokin S.
    • Antoniuk V.
    Innovations, Vol. 6 (2018), Issue 1, pg(s) 30-33
    • Abstract
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    The results of microprocessing by the ribbon-shaped electron beam of the elements of optical measuring instruments (the material of such elements – K8 glass) with the initial nanorelief of surfaces 15-22 nm after industrial grinding and polishing are presented. Based on the results of studies using a computerized complex control system based on an atomic force microscope, it was established that after electron-beam microprocessing, the nanorelief of optical elements of measuring instruments decreased to 1.5-2.2 nm, satisfying to the requirements put forward to their surfaces.

  • PECULIARITIES OF METALIZED SURFACES MODIFICATION OF SILICON ELEMENTS OF MICROELECTROMECHANICAL SYSTEMS WITH LOW-POWER ELECTRONIC FLOW

    • Bondarenko M.
    • Bondarenko I.
    • Antonyuk V.
    • Telezhynskyi D.
    • Andriienko V.
    Materials Science. Non-Equilibrium Phase Transformations., Vol. 3 (2017), Issue 2, pg(s) 53-55
    • Abstract
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    The practical possibility of the atomic force microscopy method to evaluate uniformity of thin metal coatings on silicon wafers after electronic processing has been shown in the paper. It is established that after processing of metallized surfaces of silicon plates Kp0 by an electronic flow of continuous form, the microroughness decreases in 10-15 times and the Adhesive strength increases in 1.8-2 times. At the same time, it is noted that the surface of metal coatings on silicon after electronic processing has a more homogeneous structure and released from microdefects, unlike metallized coatings without electronic processing.

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